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[CT08]
A. Coker and V. Taylor.
Performance and Reliability Analysis of a Scaled Multi-Switch Junction Crossbar Nanomemory and Demultiplexer.
In Proc. IEEE NANO Conference.
2008.
[bib]
http://prophesy.cs.tamu.edu/publications.html
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Downloads:
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Available from:
http://prophesy.cs.tamu.edu/publications.html
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