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[BSGG06]
D. Bhaduri, S. Shukla, P. Graham and M. Gokhale.
Comparing Reliability-Redundancy Trade-offs for Two Von Neumann Multiplexing Architectures.
IEEE Transactions on Nanotechnology. To appear.
2006.
http://fermat.ece.vt.edu/Fermatian_Info/debayan.html
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Available from:
http://fermat.ece.vt.edu/Fermatian_Info/debayan.html
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