[HMS15b] Ghaith Bany Hamad, Otmane Ait Mohamed, and Yvon Savaria. Efficient multilevel formal analysis and estimation of design vulnerability to Single Event Transients. In Proc. 21st IEEE International On-Line Testing Symposium (IOLTS'15), pages 1-6. 2015. [Develops a methodology to investigate the impact of Single Event Transients (SETs) on digital design reliability using PRISM.]